Scan Chain Insertion

 

All the flip-flops present in the design are replaced with the scan flip-flops (for a full scan design). The scan flip-flops are connected together in form of a chain so we call it as a scan chain. Scan chain acts as a shift register when the design is in test timing mode, Then Scan_EN (test enable signal) is active high. The first flip-flop of the scan chain is connected to the scan input port and the last flop the scan chain is connected to the scan_op scan output.

When some of the flip-flops are intentionally not converted to scan flops, such designs are called partial scan design. Making a design full scan makes the design more testable for manufacturing defects at the cost of complexity, area and power.

There are three stages of scan chain operation




          
                          

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