Scan Chain Insertion
All the flip-flops present in the design are replaced with the
scan flip-flops (for a full scan design). The scan flip-flops are connected
together in form of a chain so we call it as a scan chain. Scan chain acts
as a shift register when the design is in test timing mode, Then Scan_EN
(test enable signal) is active high. The first flip-flop of the scan chain is
connected to the scan input port and the last flop the scan chain is connected
to the scan_op scan output.
When some of the flip-flops are intentionally not
converted to scan flops,
such designs are called partial scan design. Making a design full scan makes
the design more testable for manufacturing defects at the cost of complexity,
area and power.
There are three stages of scan chain operation
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