Scan Chain Insertion
All the flip-flops present in the design are replaced with the scan flip-flops (for a full scan design). The scan flip-flops are connected together in form of a chain so we call it as a scan chain. Scan chain acts as a shift register when the design is in test timing mode, Then Scan_EN (test enable signal) is active high. The first flip-flop of the scan chain is connected to the scan input port and the last flop the scan chain is connected to the scan_op scan output. When some of the flip-flops are intentionally not converted to scan flops , such designs are called partial scan design. Making a design full scan makes the design more testable for manufacturing defects at the cost of complexity, area and power. There are three stages of scan chain operation